Hitachi S-3000N Scanning Electron Microscope (SEM) with Secondary Electron (SE), and Backscatter Electron (BSE) Detectors

  • Secondary electron resolution: 3.5 nm to 50 nm (sample dependent)
  • Backscatter electron resolution: 5.5 nm to 100 nm (sample dependent)
  • Magnification: 15 to 100,000x
  • Filament: Tungsten filament
  • Accelerating voltage: 0.3 to 30 kV
An image of our Hitachi tabletop SEM and its EDS detector.

Hitachi TM3030Plus Tabletop SEM with SE, BSE, and EDS Detectors

  • Low-vacuum conditions allow for SE and BSE image observation without metal coating
    • Secondary electrons (SE) detector shows surface details and topography
    • Back-scattered electrons (BSE) show relative compositional differences
  • The TM3030Plus can be used to view BSE images, SE images, and mixed images.
  • Magnification range : 15 to 60,000x (Up to 240,000x with digital zoom)
  • Accelerating voltage: 5 kV / 15 kV / EDX
    • 5 kV Accelerating voltage: emphasizes surface detail
    • 15 kV Accelerating voltage: can be used throughout the magnification range and gives the best resolution
    • EDX (15 kV Accelerating voltage with large current mode): used for elemental analysis or low contrast specimens
  • ThermoFisher EDS detector attached which allows for quantitative analysis of elemental composition
    • Includes quantitative graphs, point scans, and map scans