Philips PANalytical X’Pert X-Ray Diffractometer (XRD)

  • Specifications:
    • 2θ angles from 10 to 135°
    • Suitable for inorganic materials
    • Powders and solid materials at ambient temperatures
    • Particle sizing on nanomaterials
    • Pattern analysis using an ICSD database with 100,000+ material catalog
    • Rietveld analysis

Bruker D2 Phaser X-Ray Diffractometer (XRD)

  • Specifications:
    • 2θ angles from 1 to 150°
    • Rotating sample stage (φ rotation)
    • State-of-the-art Lynxeye detector
    • Phase identification with EVA software
    • COD database
    • Suitable for powder materials