Location

MCE 1325

Specifications

  • Thin film detector for low-angle measurements
  • Powder angle range of 10° to 150° 2θ
  • Variable x-ray footprint with exchangeable fixed slits
  • Kβ filtration by nickel
  • Variable tension and current between 30 kV and 10 mA to 60 kV and 40 mA
  • Ambient temperature and pressure scanning

Applications

  • Determination of amorphous content in organic or semi-organic materials
  • Mineral content determination of whole or powdered geological samples
  • Analysis of thin films such as tape-cast ceramics and vapor-deposited layers
  • Approximate particle sizing of nanomaterials

Training

Required Training

Radiation safety training is required by the U of U for anyone using radiation generating machines such as the XRD. Follow the Radiation Safety Training steps to get full instructions for the training. You can also find the relevant training links and information from the Radiation Safety Office at https://rso.utah.edu/training/. This training must be completed before coming to the MCL for testing.

Sample prep and software: https://youtu.be/_hm3QpESgkQ

Additional Resources

Percent crystallinity by integration

Thin film overview

XRD for thin films-deep dive

XRD comparision chart

 

Scheduling

If you already have an account with us, you can find the machine on Cores under Materials Characterization - Meldrum.

If you don't have an account with us yet, please review How It Works for information on getting started.