Thin Film XRD

Characterization of thin films can be performed to identify properties including the composition, crystal structure, preferred orientation, and film thickness. The MCL has a few thin-film characterization tools, including the X’Pert XRD (x-ray diffraction) and the Hitachi TM 3030+ SEM (EDS or energy dispersive x-ray spectroscopy). The crystal structure...

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Heat Capacity by the Sapphire Method

The heat capacity of a material is a crucial property to consider when determining its functionality in certain applications. The typical SI unit of heat capacity (Cp) is Joules per gram Kelvin (). It is a measurement of how sensitive a material is to changes in temperature due to...

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