Characterization of thin films can be performed to identify properties including the composition, crystal structure, preferred orientation, and film thickness. The MCL has a few thin-film characterization tools, including the X’Pert XRD (x-ray diffraction) and the Hitachi TM 3030+ SEM (EDS or energy dispersive x-ray spectroscopy). The crystal structure...
Read More >>Percent Crystallinity by the XRD Integration Method
X-ray diffraction experiments can be explained by Bragg’s law. The reflected x-rays from long-range crystallographic order planes can be predicted using the following equation. Where n is an integer, λ is the wavelength of the incident x-rays, d is the inter-atomic spacing, and θ is the angle of incidence....
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